Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2003-06-24
2008-10-14
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C365S201000
Reexamination Certificate
active
07437632
ABSTRACT:
A memory device has a number of memory segments connected to a supply source through a supply control circuit. If one of the memory segments is defective, the supply control circuit isolates the defective memory segment from the supply source. The memory device replaces the defective memory segment with a redundant segment.
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Britt Cynthia
Micro)n Technology, Inc.
Schwegman Lundberg & Woessner, P.A.
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