Method of growing a germanium epitaxial film on insulator...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C438S166000, C438S489000, C257SE21133, C257SE21572, C257SE21632

Reexamination Certificate

active

07413939

ABSTRACT:
A method of fabricating a silicon-germanium CMOS includes preparing a silicon substrate wafer; depositing an insulating layer on the silicon substrate wafer; patterning and etching the insulating layer; depositing a layer of polycrystalline germanium on the insulating layer and on at least a portion of the silicon substrate wafer; patterning and etching the polycrystalline germanium; encapsulating the polycrystalline germanium with an insulating material; rapidly thermally annealing the wafer at a temperature sufficient to melt the polycrystalline germanium; cooling the wafer to promote liquid phase epitaxy of the polycrystalline germanium, thereby forming a single crystal germanium layer; and completing the CMOS device.

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Liu et al.,High quality single-crystal Ge on insulator by liquid-phase epitaxy on Si substrate, Applied Physics Letters, vol. 84, No. 14, pp. 2563-2565 (2004).

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