MIM capacitor with a cap layer over the conductive plates

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S303000, C257SE21008, C257SE21009

Reexamination Certificate

active

07436016

ABSTRACT:
A method for forming a MIM capacitor and a MIM capacitor device formed by same. A preferred embodiment comprises selectively forming a first cap layer over a wafer including a MIM capacitor bottom plate, and depositing an insulating layer over the MIM capacitor bottom plate. The insulating layer is patterned with a MIM capacitor top plate pattern, and a MIM dielectric material is deposited over the patterned insulating layer. A conductive material is deposited over the MIM dielectric material, and the wafer is planarized to remove the conductive material and MIM dielectric material from the top surface of the insulating layer and form a MIM capacitor top plate. A second cap layer is selectively formed over the MIM capacitor top plate.

REFERENCES:
patent: 5397729 (1995-03-01), Kayanuma et al.
patent: 5547890 (1996-08-01), Tseng
patent: 5731220 (1998-03-01), Tsu et al.
patent: 5741721 (1998-04-01), Stevens
patent: 5851873 (1998-12-01), Murai et al.
patent: 5994182 (1999-11-01), Gonzalez et al.
patent: 6066892 (2000-05-01), Ding et al.
patent: 6087213 (2000-07-01), Murai et al.
patent: 6159790 (2000-12-01), González et al.
patent: 6197650 (2001-03-01), Wu
patent: 6211545 (2001-04-01), Gonzalez et al.
patent: 6221730 (2001-04-01), Honma
patent: 6235579 (2001-05-01), Lou
patent: 6238964 (2001-05-01), Cho
patent: 6294420 (2001-09-01), Tsu et al.
patent: 6313003 (2001-11-01), Chen
patent: 6329234 (2001-12-01), Ma et al.
patent: 6372574 (2002-04-01), Lane et al.
patent: 6451664 (2002-09-01), Barth et al.
patent: 6466427 (2002-10-01), Chen
patent: 6509267 (2003-01-01), Woo et al.
patent: 6576525 (2003-06-01), Stamper
patent: 6579785 (2003-06-01), Toyoda et al.
patent: 6593185 (2003-07-01), Tsai et al.
patent: 6613641 (2003-09-01), Volant et al.
patent: 6649464 (2003-11-01), Lee
patent: 6670237 (2003-12-01), Loh et al.
patent: 6716741 (2004-04-01), Chang et al.
patent: 6794262 (2004-09-01), Ning et al.
patent: 6893959 (2005-05-01), Barth
patent: 2002/0027286 (2002-03-01), Sundararajan et al.
patent: 2002/0096775 (2002-07-01), Ning
patent: 2003/0228749 (2003-12-01), Sinha et al.
Kikkawa, T., “Current and Future Low-k Dielectrics for Cu Interconnects,” 2000 IEEE.
Kikkawa, T., “A photosensitive low-k interlayer-dielectric film for ULSIs,” 2001 IEEE, pp. 348-351.
Liu, R., et al., “Single Mask Metal-Insulator-Metal (MIM) Capacitor with Copper Damascene Metallization for Sub-0.18μm Mixed Mode Signal and System-on-a-Chip (SoC) Applications,” 2000 IEEE, Proceedings IITC, pp. 111-113.
Lopatin, S. D., et al., “Thin Electroless Barrier for Copper Films,” SPIE Conference on Multilevel Interconnect Technology II, vol. 3508, Sep. 1998, Santa Clara, California, pp. 65-77.
Mahnkopf, R., et al., “‘System on a Chip’ Technology Platform for 0.18μm Digital, Mixed Signal & eDRAM Applications,” 1999 IEEE, IEDM, pp. 849-852.
Segawa, Y., et al., “Manufacturing-ready Selectivity of CoWP Capping on Damascene Copper Interconnects,” 2002 Conference Proceedings ULSI XVII, Materials Research Society, pp. 567-572.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MIM capacitor with a cap layer over the conductive plates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MIM capacitor with a cap layer over the conductive plates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MIM capacitor with a cap layer over the conductive plates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3998506

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.