Non-volatile memory device and method for fabricating the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Reexamination Certificate

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C438S199000, C438S201000, C438S257000, C438S581000, C438S630000, C438S649000, C438S651000, C438S682000, C438S721000, C438S755000, C257S315000, C257S316000, C257SE21209, C257SE21422, C257SE21613, C257SE21659, C257SE21685

Reexamination Certificate

active

07425482

ABSTRACT:
A non-volatile memory device and a method for fabricating the same are provided. The method includes: forming a plurality of gate structures on a substrate, each gate structure including a first electrode layer for a floating gate; forming a first insulation layer covering the gate structures and active regions located at each side of the gate structures; forming a second electrode layer over the first insulation layer; and forming a plurality of control gates on the active regions located at each side of the gate structures by performing an etch-back process to the second electrode layer.

REFERENCES:
patent: 5414286 (1995-05-01), Yamauchi
patent: 6451652 (2002-09-01), Caywood et al.
patent: 2004/0151028 (2004-08-01), Chih et al.

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