Testing memory units in a digital circuit

Details Testing memory units in a digital circuit Testing memory units in a digital circuit

2003-05-20

2008-03-11

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

07343532

ABSTRACT:
A method of testing a memory unit in a digital circuit includes storing a test pattern on a register of the digital circuit. The register is then selected by providing an activation signal to a selection unit. The memory unit is then tested with the test pattern stored in the register.

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German Office Action dated May 24, 2002(3 pages).

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