Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-03-14
2008-03-25
Tran, Minhloan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S693000, C257S698000, C257S728000, C257SE23179, C438S014000, C438S015000, C438S018000, C324S765010
Reexamination Certificate
active
07348597
ABSTRACT:
Various apparatus for performing high frequency electronic package testing are disclosed. A test fixture assembly includes an electronics package having an interface structure, a mock-up IC, coupled to the interface structure for providing circuit connections, and a fixture board, coupled to the interface structure, wherein at least one of the fixture board and mock-up IC includes high frequency probe pads for providing a signal and ground point for high bandwidth test probing. Raw measurements are used for validation of the electronic package specifications when adequate test fixture bandwidth is available or included into circuit simulations models when a minimal phase error is acceptable, else phase and loss corrections are applied to the measurements.
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Bibee Matthew L.
Degerstrom Michael J.
Hulse Daniel V.
Liu Banjamin Tzu-Hung
Maunu LeRoy D.
Tran Minhloan
Xilinx , Inc.
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