Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-22
2008-07-22
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11250377
ABSTRACT:
In a semiconductor integrated circuit inspection method of inspecting a semiconductor integrated circuit including plural transistors according to which a test pattern generated for the semiconductor integrated circuit is input to an input terminal of the semiconductor integrated circuit, the time during which a voltage applied upon each of the transistors remains equal to or higher than a predetermined voltage is measured in response to inputting of the test pattern at the input terminal, and the ratio of thus measured time to the inspection time for the semiconductor integrated circuit is calculated. In certain example embodiments of this invention, this is advantageous in that it may be possible to verify whether a generated test pattern is preferable by grasping a state of voltage applied upon each transistor during a reliability test, so as to help maintain accuracy of reliability testing.
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Nixon & Vanderhye P.C.
Sandoval Patrick
Sharp Kabushiki Kaisha
Siek Vuthe
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