Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-04-08
2008-04-08
Quach, T. N. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257SE29300
Reexamination Certificate
active
11307874
ABSTRACT:
A non-volatile memory including a substrate, a select gate, two floating gates, a control gate, and a doped region is described. The select gate is disposed on the substrate. The two floating gates are disposed on both sides of the select gate, and the top surface of the floating gates is higher than that of the select gate forming a hollow structure on the select gate between the two floating gates. The control gate disposed on the substrate covers the select gate and the two floating gates and fills the hollow structure. The doped region is disposed in the substrate on one side of the two floating gates opposite to the select gate.
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Lai Liang-Chuan
Wang Pin-Yao
Jianq Chyun IP Office
Powerchip Semiconductor Corp.
Quach T. N.
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