Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-12-11
2007-12-11
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11015219
ABSTRACT:
Described is a system and method of designing a length of an electrical trace used to implement a point-to-point serial link for conveying a digital signal between a transmitter and a receiver. A trace segment of the electrical trace is identified. The trace segment has a first endpoint determined by a first impedance discontinuity on the point-to-point serial link and a second endpoint determined by a second impedance discontinuity on the point-to-point serial link. A restricted length is calculated for the trace segment based on a propagation delay of the signal along the trace segment and a frequency of the signal. A length of the trace segment is set to be unequal to the restricted length.
REFERENCES:
patent: 6687842 (2004-02-01), DiStefano et al.
patent: 7032189 (2006-04-01), Upton et al.
patent: 7042067 (2006-05-01), Giaretta et al.
patent: 7170166 (2007-01-01), Rofougaran
Chiang Jack
Guerin & Rodriguez LLP
Rodriguez Michael A.
Tat Binh
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