One-time programmable circuit exploiting BJT h FE degradation

Details One-time programmable circuit exploiting BJT h FE degradation One-time programmable circuit exploiting BJT h FE degradation

2007-11-06

2007-11-06

Chang, Daniel D. (Department: 2819)

Electronic digital logic circuitry

Multifunctional or programmable

Bipolar transistor

C326S037000, C365S096000, C365S104000

Reexamination Certificate

active

11115538

ABSTRACT:
A one-time programmable circuit uses forced BJT hFEdegradation to permanently store digital information as a logic zero or logic one state. The forced degradation is accomplished by applying a voltage or current to the BJT for a specific time to the reversed biased base-emitter junction, allowing a significant degradation of the junction without destroying it.

REFERENCES:
patent: 3733690 (1973-05-01), Rizzi et al.
patent: 3742592 (1973-07-01), Rizzi et al.
patent: 4703455 (1987-10-01), Bynum
patent: 5625205 (1997-04-01), Kusma

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