Probeless fixture for adapter card testing

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement

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Details

439 66, H01R 1118

Patent

active

057919348

ABSTRACT:
A tester having as an interconnect structure a pair of resilient, elastomeric, vise-like interconnect grips having conductive tracings thereon. This interconnect structure provides electrical conduction between the conductive tabs of an adapter card under test and the tester.

REFERENCES:
patent: 3858958 (1975-01-01), Davies
patent: 3985413 (1976-10-01), Evans
patent: 4473798 (1984-09-01), Cedrone et al.
patent: 5141444 (1992-08-01), Redmond et al.
patent: 5273450 (1993-12-01), Renn et al.
patent: 5306161 (1994-04-01), Volz et al.
patent: 5308250 (1994-05-01), Walz
patent: 5313368 (1994-05-01), Volz et al.
"High-Density Probing Using Elastomeric Connectors," IBM Technical Disclosure Bulletin, vol. 33 No. 5, Oct. 1990, pp. 301-302.

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