Electrical computers and digital processing systems: memory – Storage accessing and control – Memory configuring
Reexamination Certificate
2007-08-21
2007-08-21
Nguyen, Hiep T. (Department: 2187)
Electrical computers and digital processing systems: memory
Storage accessing and control
Memory configuring
Reexamination Certificate
active
10954708
ABSTRACT:
A method for allowing native, functional, and test configurations of a memory to be independent of one another includes steps as follows. A memory is first provided. The memory has a native configuration including k words and n data output pins, k and n being positive integers. Each of the k words has a width of n bits. Then the n data output pins are connected to a programmable multiplexer for multiplexing the n data output pins into at least one group of data output pins of the programmable multiplexer. Each of the at least one group of data output pins has no more than n data output pins and is suitable for enabling the memory to have at least one of a test configuration or a functional configuration. At user's discretion, the test configuration may or may not have a width of n bits, the functional configuration may or may not have a width of n bits, and the test configuration and the functional configuration may or may not have the same width.
REFERENCES:
patent: 5963488 (1999-10-01), Inoue
patent: 6046923 (2000-04-01), Evans
Agrawal Ghasi R.
Chan Willie K.
LSI Corporation
Nguyen Hiep T.
Suiter Swantz PC LLO
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