Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-19
2007-06-19
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S002000
Reexamination Certificate
active
11032720
ABSTRACT:
A method and apparatus calculate resistance of a three-dimensional conductor system defined by boundary faces. The resistance calculation includes (a) partitioning the three-dimensional shape into a plurality of parallelepipeds, a boundary between two parallelepipeds forms and entire face for both of the two parallelepipeds, (b) determining at least one source face and at least one sink face from among the boundary faces, a current entering the conductor system through the source face and leaving the conductor system through the sink face, (c) setting boundary conditions with respect to the current for each of the parallelepipeds, (d) calculating power for each of the parallelepipeds with the boundary conditions, (e) calculating power for the conductor system based on the power and the boundary conditions of each of the parallelepipeds, and (f) obtaining the resistance of the conductor system by minimizing dissipation of the calculated power of the conductor system.
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Brown Thelen Reid
Kik Phallaka
LSI Corporation
Raysman & Steiner LLP
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