Shape based noise characterization and analysis of LSI

Details Shape based noise characterization and analysis of LSI Shape based noise characterization and analysis of LSI

2007-02-13

2007-02-13

Thangavelu, Kandasamy (Department: 2123)

Data processing: structural design, modeling, simulation, and em

Modeling by mathematical expression

C702S065000, C702S070000, C702S067000, C703S014000, C703S016000, C703S018000, C716S030000

Reexamination Certificate

active

10340222

ABSTRACT:
The invention allows the inclusion of cross-talk coupling and other noise in circuit simulation by considering a resultant glitch in more detail than just its peak value. A set of parameters represents the noise, with an exemplary embodiment using a triangle approximation to a glitch based on a set of three parameters: the peak voltage value, the leading edge slope and the trailing edge slope. These values are then used as the input stimulus to a given cell instance in the network in which the resulting propagated noise values, also in a triangle approximation, are determined by a simulation. The results can be stored as a library so that, given the parameters of the input noise and the particular cell, a simulation can determine the propagated noise through a look-up process. To reduce the space requirements of the library, the dimensionality of the look-up tables can be reduced through the introduction of a set of auxiliary functions to offset error from this reduction.

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