4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

I-Hsien Chen

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Shape based noise characterization and analysis of LSI

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate

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Shape based noise tolerance characterization and analysis of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2771272

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