Static information storage and retrieval – Addressing – Plural blocks or banks
Reexamination Certificate
2007-07-24
2007-07-24
Phan, Trong (Department: 2827)
Static information storage and retrieval
Addressing
Plural blocks or banks
C365S230060, C365S189110
Reexamination Certificate
active
11344018
ABSTRACT:
Semiconductor memory devices having a negatively biased sub-word line scheme and methods of driving the same are disclosed. In a semiconductor memory device, NMOS transistors for pulling down a word line enable signal and a word line driving signal to a negative voltage are adjusted to a negative voltage. The negatively biased word line scheme may decrease influx of discharge current into the negative voltage source and decrease negative voltage fluctuations and associated noise.
REFERENCES:
patent: 4821234 (1989-04-01), Nakase
patent: 5406526 (1995-04-01), Sugibayashi et al.
patent: 5650976 (1997-07-01), McLaury
patent: 5856952 (1999-01-01), Yoo et al.
patent: 5940343 (1999-08-01), Cha et al.
patent: 5986917 (1999-11-01), Lee
patent: 6069838 (2000-05-01), Jeong
patent: 6111808 (2000-08-01), Khang et al.
patent: 6181636 (2001-01-01), Lee et al.
patent: 6201745 (2001-03-01), Ryu et al.
patent: 6510094 (2003-01-01), Chung et al.
patent: 6545923 (2003-04-01), Sim et al.
patent: 6845049 (2005-01-01), Lim et al.
patent: 6973007 (2005-12-01), Kim
patent: 10241361 (1998-09-01), None
patent: 1020000045870 (2000-07-01), None
patent: 1020010059020 (2001-07-01), None
patent: 1020040022090 (2004-03-01), None
Myers Bigel & Sibley Sajovec, PA
Phan Trong
Samsung Electronics Co,. Ltd.
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