Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-09
2007-01-09
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S343000, C257S389000, C257S408000, C257SE29261, C257SE29268
Reexamination Certificate
active
10738002
ABSTRACT:
A semiconductor device is provided with a gate electrode formed over a substrate that has gate oxide films disposed thereon. Source-drain regions of low and high concentration are formed next to the gate electrode. A diffusion region width of the source side of the source-drain regions is smaller than at least a diffusion region width of the drain side.
REFERENCES:
patent: 5304827 (1994-04-01), Malhi et al.
patent: 5412241 (1995-05-01), Merchant
patent: 5592014 (1997-01-01), Funaki et al.
patent: 5640040 (1997-06-01), Nakagawa et al.
patent: 6117738 (2000-09-01), Tung
patent: 6118152 (2000-09-01), Yamaguchi et al.
patent: 6127703 (2000-10-01), Letavic et al.
patent: 6180983 (2001-01-01), Merrill
patent: 6191453 (2001-02-01), Petruzzello et al.
patent: 6288424 (2001-09-01), Ludikhuize
patent: 6380566 (2002-04-01), Matsudai et al.
patent: 6424005 (2002-07-01), Tsai et al.
patent: 0 537 684 (1998-05-01), None
patent: 1243472 (1989-09-01), None
patent: 5267652 (1993-10-01), None
patent: 11330459 (1999-11-01), None
patent: 2000232224 (2000-08-01), None
Kikuchi Shuichi
Nishibe Eiji
Suzuki Takuya
Fish & Richardson P.C.
Parker Kenneth
Sanyo Electric Co,. Ltd.
Warren Matthew E.
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