Triple pulse method for MRAM toggle bit characterization

Details Triple pulse method for MRAM toggle bit characterization Triple pulse method for MRAM toggle bit characterization

2007-01-02

2007-01-02

Tran, Andrew Q. (Department: 2824)

Static information storage and retrieval

Systems using particular element

Magnetic thin film

C365S158000, C365S201000, C365S236000

Reexamination Certificate

active

11118145

ABSTRACT:
A method is provided for testing magnetic bits (3, 104, 514) of an array. A train of first (702), second (704), and third (706) pulses is provided to a desired bit, the first and second pulses beginning at a substantially similar low field and increasing in similar amounts with respect to successive trains of the first, second, and third pulses, the third pulse having a current amplitude sufficient to toggle the magnetic bit. A representative count is recorded in response to switching of the bit. The above steps are repeated and a determination is made of the current amplitude required to write and toggle the bit.

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D.C. Worledge, “Magnetic phase diagram of two identical coupled nanogmagnets”, Applied Physics Letters, vol. 84, No. 15, Apr. 12, 2004, pp. 2847-2849.
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