Redundancy circuits for semiconductor memory

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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Reexamination Certificate

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11108179

ABSTRACT:
A semiconductor random access memory device has an array of normal memory and an array of dummy memory cells. The array of the dummy memory cells are controlled in order to form a redundant twin-cell structure that includes at least one of the dummy memory cells.

REFERENCES:
patent: 5022006 (1991-06-01), Fifield et al.
patent: 5495445 (1996-02-01), Proebsting
patent: 5945702 (1999-08-01), Nakanishi
patent: 6292383 (2001-09-01), Worley
patent: 6304499 (2001-10-01), Pöchmüller
patent: 6426269 (2002-07-01), Haffner et al.
patent: 6865124 (2005-03-01), Takase
patent: 2003/0043645 (2003-03-01), Pinney

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