Stacked capacitor-type semiconductor storage device and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S311000, C257SE27088

Reexamination Certificate

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11333412

ABSTRACT:
First and second wirings are formed on a first insulating film. Each of the wirings is arranged so that a conductive film, a silicon oxide film and a silicon nitride film are laminated. Thereafter, a silicon oxide insulating film is formed on the whole surface. The silicon oxide insulating film is etched so that a contact hole is formed between the first and second wirings. Since the silicon oxide film and the silicon nitride film exist on the conductive film of each wiring, the conductive film is not exposed at the time of etching. Thereafter, an insulating film is formed on a side wall of the contact hole, and the conductive film exposed through the contact hole is covered by the insulating film.

REFERENCES:
patent: 4977105 (1990-12-01), Okamoto et al.
patent: 5037777 (1991-08-01), Mele et al.
patent: 5055423 (1991-10-01), Smith et al.
patent: 5061650 (1991-10-01), Dennison et al.
patent: 5082797 (1992-01-01), Chang et al.
patent: 5100826 (1992-03-01), Dennison
patent: 5198384 (1993-03-01), Dennison
patent: 5200358 (1993-04-01), Bollinger et al.
patent: 5275972 (1994-01-01), Ogawa et al.
patent: 5279982 (1994-01-01), Crotti
patent: 5312769 (1994-05-01), Matsuo et al.
patent: 5466639 (1995-11-01), Ireland
patent: 5482894 (1996-01-01), Havemann
patent: 5578524 (1996-11-01), Fukase et al.
patent: 5631179 (1997-05-01), Sung et al.
patent: 5643833 (1997-07-01), Tsukamoto
patent: 5667918 (1997-09-01), Brainerd et al.
patent: 5828094 (1998-10-01), Lee
patent: 5840621 (1998-11-01), Kasai
patent: 5841195 (1998-11-01), Lin et al.
patent: 5977583 (1999-11-01), Hosotani et al.
patent: 6333538 (2001-12-01), Hosotani et al.
patent: 2249429 (1992-05-01), None
patent: 03-064964 (1991-03-01), None
patent: 03-108359 (1991-05-01), None
patent: 06-005714 (1994-01-01), None
patent: 06-037273 (1994-02-01), None
patent: 06-061361 (1994-03-01), None
patent: 06-120447 (1994-04-01), None
patent: 06-338597 (1994-12-01), None
M. Fukumoto et al., “Stacked capacitor cell technology for 16 M DRAM using double self aligned contacts”, ESSDERC 90, pp. 461-464, 1990.

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