Floating gate and fabricating method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29129, C257SE29300

Reexamination Certificate

active

10764037

ABSTRACT:
A floating gate and fabrication method thereof. A semiconductor substrate is provided, on which an oxide layer, a first conducting layer, and a patterned hard mask layer having an opening are sequentially formed. A spacer is formed on the sidewall of the opening. A second conducting layer is formed on the hard mask layer. The second conducting layer is planarized to expose the surface of the patterned hard mask layer. The surface of the second conducting layer is oxidized to form an oxide layer. The patterned hard mask layer and the oxide layer and the first conducting layer underlying the patterned hard mask layer are removed.

REFERENCES:
patent: 5281548 (1994-01-01), Prall
patent: 5493138 (1996-02-01), Koh
patent: 5796140 (1998-08-01), Tomioka
patent: 5858840 (1999-01-01), Hsieh et al.
patent: 5872036 (1999-02-01), Sheu
patent: 6093945 (2000-07-01), Yang
patent: 6130132 (2000-10-01), Hsieh et al.
patent: 6180980 (2001-01-01), Wang
patent: 6229176 (2001-05-01), Hsieh et al.
patent: 6248631 (2001-06-01), Huang et al.
patent: 6262452 (2001-07-01), Ono et al.
patent: 6300196 (2001-10-01), Chang
patent: 6323514 (2001-11-01), Kao
patent: 6333228 (2001-12-01), Hsieh et al.
patent: 6413818 (2002-07-01), Huang et al.
patent: 6448605 (2002-09-01), Chang
patent: 6504207 (2003-01-01), Chen et al.
patent: 6528844 (2003-03-01), Hopper et al.
patent: 6562673 (2003-05-01), Lin
patent: 6589842 (2003-07-01), Huang
patent: 6646301 (2003-11-01), Yamada
patent: 6653188 (2003-11-01), Huang et al.
patent: 6660588 (2003-12-01), Yang et al.
patent: 6713834 (2004-03-01), Mori et al.
patent: 6770520 (2004-08-01), Chuang et al.
patent: 6781186 (2004-08-01), Wu
patent: 6876032 (2005-04-01), Hsieh
patent: 2002/0017680 (2002-02-01), Na et al.
patent: 2002/0072184 (2002-06-01), Higuchi
patent: 2002/0187608 (2002-12-01), Tseng
patent: 2003/0111685 (2003-06-01), Kobayashi et al.
patent: 2003/0162347 (2003-08-01), Wang
patent: 2003/0219943 (2003-11-01), Lin et al.

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