Semiconductor devices with reduced impact from alien particles

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S204000, C257S347000, C257S610000

Reexamination Certificate

active

10972618

ABSTRACT:
An improved semiconductor device is disclosed with a NMOS transistor formed on a P-Well in a deep N-well, a PMOS transistor formed on a N-Well in the deep N-well, a first voltage coupled to a source node of the PMOS, and a second voltage higher than the first voltage coupled to the N-well, wherein the second voltage expands a depletion region associated with the PMOS and NMOS transistor for absorbing electrons and holes caused by alien particles.

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Intel Corporation, The Semiconductor Memory Book, 1978, John Wiley and Sons, pp. 39-47.

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