Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2007-05-29
2007-05-29
Chu, John S. (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S905000, C430S910000
Reexamination Certificate
active
09729953
ABSTRACT:
A positive type photoresist composition suitable for light in the wavelength region of 170 nm to 220 nm, high in sensitivity, excellent in adhesion and giving a good resist pattern profile, which comprises a resin having an ester group represented by the following general formula [I] in its molecule and a compound generating an acid by irradiation of an active light ray or radiation:wherein R1represents a hydrogen atom, an alkyl group or a cycloalkyl group; and R2and R3, which may be the same or different, each represents a hydrogen atom, an alkyl group, a cycloalkyl group or -A-R4, and R2and R3may combine together to form a ring, wherein R4represents a hydrogen atom, an alkyl group or a cycloalkyl group, R4and R2or R3may combine together to form a ring, and A represents an oxygen atom or a sulfur atom.
REFERENCES:
patent: 5621019 (1997-04-01), Nakano et al.
patent: 5677405 (1997-10-01), Goodall et al.
patent: 5968713 (1999-10-01), Nozaki et al.
patent: 6013416 (2000-01-01), Nozaki et al.
patent: 6060207 (2000-05-01), Shida et al.
patent: 6150068 (2000-11-01), Sato et al.
patent: 6200725 (2001-03-01), Takechi et al.
patent: 6329125 (2001-12-01), Takechi et al.
patent: 6388101 (2002-05-01), Hada et al.
patent: 196 26 003 (1996-06-01), None
patent: 0 856 773 (1998-08-01), None
patent: 7-252324 (1995-10-01), None
patent: 8-82925 (1996-03-01), None
patent: 10-177247 (1998-06-01), None
patent: 10-207069 (1998-08-01), None
patent: 10-274852 (1998-10-01), None
Aoai Toshiaki
Sato Kenichiro
Chu John S.
Fujifilm Corporation
Sughrue & Mion, PLLC
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