Semiconductor memory device adapted to carry out operation test

Details Semiconductor memory device adapted to carry out operation test Semiconductor memory device adapted to carry out operation test

1986-06-17

1988-01-19

Moffitt, James W.

Static information storage and retrieval

Read/write circuit

Testing

G11C 2900

Patent

active

047208180

ABSTRACT:
In order to facilitate a test of the operations of a semiconductor memory device, the semiconductor memory device includes a line selection checking unit coupled to a cell matrix and column gates to form a logic gate circuit unit consisting of a plurality of transistors, the gates of the transistors being connected to word lines or bit lines. The line selection checking unit has a voltage or current detection portion connected to a pad for detecting an output voltage or current of the line selection checking unit.

REFERENCES:
patent: 4456980 (1984-06-01), Yamada et al.

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