Circuit for computing moment pre-products for statistical...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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C702S180000, C708S208000

Reexamination Certificate

active

11460591

ABSTRACT:
A circuit for computing moment pre-products for statistical analysis reduces data transfer volume for on-chip statistical measurements. The circuit calculates the sums of multiple exponentiations of outputs of one or more measurement circuits, thereby reducing the amount of data that must be transferred from a wafer. An integer scaling of the input data is arranged between zero and unity so that the exponentiations all similarly lie between zero and unity. The circuit can use look-up tables and adder/accumulators to accumulate the contributions of each measurement to each exponentiation, or use a multiplier arrangement to determine the contributions. The multipliers can be implemented in the adder/accumulators by clocking the adder/accumulators by corresponding counts determined from the measurement data and lower-order exponentiations. Ranges of the measurement values are determined by capturing maximum and minimum values using comparators as the measurements are input.

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patent: 4982342 (1991-01-01), Moribe et al.
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patent: 6615229 (2003-09-01), Vijayrao et al.
patent: 6704895 (2004-03-01), Swoboda et al.
Wan-Chi Siu, “Efficient computation of moments for pattern recognition”, May 9-10, 1991, IEEE Pacific Rim Conference on Communications, Computers and Signal Processing, vol. 2, pp. 589-592.

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