Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-09-11
2007-09-11
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S1540PB
Reexamination Certificate
active
11027057
ABSTRACT:
An apparatus for generating a current source test stimulus signal having a constant current regardless of an internal impedance value of a device under test includes a voltage source generation unit and a voltage to current (V/I) converter. The voltage source generation unit converts source data stored in internal memory into analog signals, and combines the analog signals and a reference signal of D/C voltage level to generate voltage source test stimulus signals. The V/I converter converts the voltage source test stimulus signals into current source test stimulus signals and outputs the current source test stimulus signal to a device under test. The V/I converter maintains the current levels of the current source test stimulus signals at a predetermined value, regardless of the internal impedance of input pins of the device under test. In this manner, the operating efficiency of the device under test can be accurately determined.
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Jang Jin-mo
Kim Jung-hye
Kim Young-bu
Mills & Onello LLP
Patel Paresh
Samsung Electronics Co,. Ltd.
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