Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-08-22
2006-08-22
Nadav, Ori (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S311000
Reexamination Certificate
active
07095068
ABSTRACT:
A semiconductor memory device includes a semiconductor substrate, a first transistor formed on the semiconductor substrate and including a first gate electrode and first and second diffusion layers, a first contact connected to the first diffusion layer, a first conductive oxygen barrier film electrically connected to the first contact and covering at least the upper surface of the first contact, a first ferroelectric capacitor including a first electrode, a second electrode, and a first ferroelectric film interposed between the first and second electrodes, and a first connecting member connected to the first electrode and to the first conductive oxygen barrier film.
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Kanaya Hiroyuki
Kumura Yoshinori
Kunishima Iwao
Ozaki Tohru
Watanabe Shin-ichi
Kabushiki Kaisha Toshiba
Nadav Ori
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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