Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-08-22
2006-08-22
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07096433
ABSTRACT:
A method and chip design are provided for reducing power consumption. A first functional block having a phase logic circuit may be provided in a first area of a chip. A second functional block having an edge-triggered circuit may be provided in a second area of the chip. Edge-triggered circuits within the second functional block may be replaced with dual edge-triggered circuits. Phase logic circuits may be clocked by a full frequency clock signal and dual edge-triggered circuits may be clocked by a half-frequency clock signal.
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James Tschanz et al.; “Comparative Delay and Energy of Single Edge-Triggered & Dual Edge-Triggered Pulsed Flip-Flops for High-Performance Microprocessors, Microporcessor Research Labs, Intel Corporation,” ISPLED '01, Aug. 6-7, 2001, Huntington Beach, CA; pp. 147-152.
Barkatullah Javed
De Vivek K.
Kurd Nasser A.
Tschanz James W.
Dinh Paul
Fleshner & Kim LLP
Intel Corporation
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