Semiconductor memory devices having extending contact pads...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S250000, C438S256000, C438S399000

Reexamination Certificate

active

07144798

ABSTRACT:
An integrated circuit device having a semiconductor substrate includes a gate structure on the semiconductor substrate. Source/drain regions are on opposite sides of the gate structure. A contact pad is on at least one of the source/drain region, and a silicide cap is on a surface of the contact pad opposite the respective source/drain region.

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patent: 14-083943 (2002-03-01), None
patent: 1999-0077754 (1999-10-01), None
Notice of Office Action, Korean Application No. 10-2002-0046573, May 28, 2004.

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