Method and structure for generating offset fields for use in...

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S171000, C365S173000, C257S427000

Reexamination Certificate

active

07133309

ABSTRACT:
A method for generating an offset field for a magnetic random access memory (MRAM) device includes forming a first pinned layer integrally with a wordline, and forming a second pinned layer integrally with a bitline. An MRAM cell is disposed between the wordline and the bitline, the MRAM cell including a reference layer, an antiparallel free layer and a tunnel barrier therebetween. The first pinned layer is formed with an internal magnetization in a manner so as to create a first external field generally perpendicular to a long axis of the wordline, and the second pinned layer is formed with an internal magnetization in a manner so as to create a second external field generally perpendicular to a long axis of the bitline.

REFERENCES:
patent: 6522573 (2003-02-01), Saito et al.
patent: 6545906 (2003-04-01), Savtchenko et al.
patent: 6633498 (2003-10-01), Engel et al.
patent: 6865109 (2005-03-01), Covington
patent: 2005/0253128 (2005-11-01), Worledge
patent: 2005/0274997 (2005-12-01), Gaides et al.
M. Durlam et al.; “A 0.18um 4Mb Toggling MRAM;” IEEE 2003.
W. Reohr et al.; “Memories of Tomorrow;” IEE Circuits & Devices Magazine, Sep. 2002, pp. 17-27.
D.C. Worledge, “Spin Flop Switching For Magnetic Random Access Memory”, Applied Physics Letters, vol. 84, No. 22, May 31, 2004, pp. 4559-4561.

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