Method of fabricating a device including compound semiconductor

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438481, 438519, 438514, 438 46, H01L 21208

Patent

active

060460962

ABSTRACT:
A method of fabricating a compound semiconductor layer structure including a layer containing nitrogen is provided. In a method of fabricating a device including a compound semiconductor layer structure, a portion of crystal of compound semiconductor, which is to be at least a portion of a function layer of the device, is irradiated with material including at least nitrogen, and element of V group of the irradiated portion is substituted by the nitrogen. In a fabrication method, a thickness of the N-substituted layer does not exceed its critical layer thickness. In a fabrication method, a depth of the N-substituted portion is controlled by using material for oppressing the substitution by nitrogen.

REFERENCES:
patent: 4378259 (1983-03-01), Hasegawa et al.
patent: 4510515 (1985-04-01), Kajita et al.
patent: 4735910 (1988-04-01), Mitsuyu et al.
patent: 4792467 (1988-12-01), Melas et al.
patent: 5057442 (1991-10-01), Habuka
patent: 5168330 (1992-12-01), Vikavage et al.
patent: 5373175 (1994-12-01), Ozawa et al.
patent: 5383211 (1995-01-01), Van de Walle et al.
patent: 5445897 (1995-08-01), Satoh et al.
patent: 5456765 (1995-10-01), Sato et al.
patent: 5496766 (1996-03-01), Amano et al.
patent: 5597761 (1997-01-01), Adomi et al.
patent: 5604135 (1997-02-01), Edmond et al.
patent: 5689123 (1997-11-01), Major et al.
patent: 5723383 (1998-03-01), Kosugi et al.
patent: 5734182 (1998-03-01), Nakamura et al.
patent: 5740192 (1998-04-01), Hatano et al.
patent: 5751026 (1998-05-01), Sato et al.
patent: 5753039 (1998-05-01), Hishida et al.
patent: 5759264 (1998-06-01), Watanabe et al.
patent: 5804834 (1998-09-01), Shimoyama et al.
patent: 5856208 (1999-01-01), Sato et al.
Weyers M et al: "Growth of GAASN Alloys by Low-Pressure Metalorganic Chemical Vapor Deposition Using Plasma-Cracked NH3" Applied Physics Letters, vol. 62, No. 12, Mar. 22, 1993, pp. 1396-1398, XP000354549.
Sato M: "Plasma-Assisted MOCVD Growth of GAAS/GAN/GAAS Thin-Layer Structures by N-AS Replacement Using N-Radicals", International Conference on Solid State Devices and Materials, Aug. 23, 1994; pp. 7-9, XP 000543870 .

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating a device including compound semiconductor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating a device including compound semiconductor , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating a device including compound semiconductor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-364572

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.