Semiconductor device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S369000

Reexamination Certificate

active

07115950

ABSTRACT:
A semiconductor device comprises; a MOS transistor formed on a semiconductor layer of an SOI substrate in which the semiconductor layer is formed on a semiconductor substrate with intervention of a buried insulating film, and a contact portion for applying to the semiconductor substrate different bias voltages in an operating state and a standby state of a semiconductor circuit including the MOS transistor.

REFERENCES:
patent: 5557231 (1996-09-01), Yamaguchi et al.
patent: 6043536 (2000-03-01), Numata et al.
patent: 6072217 (2000-06-01), Burr
patent: 2005/0253197 (2005-11-01), Tokushige
patent: 8-32040 (1996-02-01), None
patent: 8-222705 (1996-08-01), None
patent: 10-125925 (1998-05-01), None
patent: 10-141487 (1998-05-01), None
patent: 96-12470 (1996-04-01), None
U.S. Appl. No. 09/660,926, filed Sep. 13, 2000.
A. Yoshino, et al., IEEE Intl. SOI Conference, Oct. 1995, “Highspeed Performance of 0.35 Mm CMOS Gates Fabriccated . . . ”, p. 4.
Copy of Korean Publication dated Apr. 30, 2002.

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