Distributed failure analysis memory for automatic test...

Details Distributed failure analysis memory for automatic test... Distributed failure analysis memory for automatic test...

2006-10-03

2006-10-03

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S724000, C365S200000

Reexamination Certificate

active

07117410

ABSTRACT:
A failure analysis memory is disclosed for use with a semiconductor tester for storing bit image failure information relating to a memory-under-test. The semiconductor tester has a plurality of channel cards disposed proximate the memory-under-test. The failure analysis memory includes a memory controller and a plurality of memory units disposed in communication with the memory controller. The memory units are distributed on the channel cards.

REFERENCES:
patent: 6138257 (2000-10-01), Wada et al.
patent: 6286120 (2001-09-01), Reichert et al.
patent: 6389525 (2002-05-01), Reichert et al.
patent: 6449741 (2002-09-01), Organ et al.
patent: 6536005 (2003-03-01), Augarten
patent: 6553529 (2003-04-01), Reichert
patent: 6567941 (2003-05-01), Turnquist et al.
patent: 6574764 (2003-06-01), Krech et al.
NN84045996 IBM TDB “Universal Physical Memory Bit Fal Map” Kurth etal. vol. 26 No. 11 Apr. 1984.
“Test Response Compression and Bitmap Encoding for Embedded Memories in Manufacturing Process Monitoring” by Chen et al. This paper appears in: International Test Conference Proceedings. Pub Date: 2001 pp. 258-267 INSPEC Accession No. 7211343.

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