Semiconductor device

Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination

Reexamination Certificate

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Details

C326S026000, C326S027000, C326S028000, C326S029000, C326S115000, C326S116000, C326S117000, C326S118000, C326S119000, C326S120000, C326S121000, C326S122000, C326S123000, C326S124000, C326S125000, C326S126000, C326S127000, C326S128000, C326S129000, C333S032000

Reexamination Certificate

active

07106093

ABSTRACT:
A semiconductor device having a plurality of cascaded IC's (14, 15, 16), wherein the matching impedance between a signal transmission path (12) connected to an external signal transmission path and an input-side or output-side IC (14, 16) is set at 50 ohms which is equal to the characteristics impedance of the external signal transmission path. The matching impedance between a internal signal transmission path (13) and an input-side or output-side IC or intermediate IC is set at 200 ohms which is higher than the 50 ohms. The semiconductor device reduces the current dissipation and can operate at a higher speed.

REFERENCES:
patent: 5099152 (1992-03-01), Suzuki
patent: 5111080 (1992-05-01), Mizukami et al.
patent: 6046653 (2000-04-01), Yamada
patent: 6781404 (2004-08-01), Suzuki et al.
patent: 6784674 (2004-08-01), Miller
patent: 5-48350 (1993-02-01), None
patent: 5-62844 (1993-09-01), None
patent: 2503913 (1996-06-01), None
patent: 10-84260 (1998-03-01), None
patent: 11-220336 (1999-08-01), None
patent: 11-297936 (1999-10-01), None
A copy of the International Search Report issued for the parent PCT application, no month and date.

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