Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S394000

Reexamination Certificate

active

07105901

ABSTRACT:
An active area (1) is provided with a concave part in its corner portion in a shape along a plan view. An insulating film (7) encloses this active area. A gate electrode (30) is arranged on a depressed region (DR) having an edge portion which is located on a low position due to the concave part, while a gate electrode (20) is arranged on an ordinary region (OR) having an edge portion projecting beyond the depressed region. A gate end cap (margin part) of the gate electrode (20) has a length x, while that of the gate electrode (30) has a length x+α. Thus provided is a semiconductor device causing no current defect between source/drain regions even if the active area and an insulating film defining this active area fail to satisfy the layout design following refinement of the semiconductor device.

REFERENCES:
patent: 5148244 (1992-09-01), Iwasaki
patent: 5164811 (1992-11-01), Tamura
patent: 5496754 (1996-03-01), Bergemont et al.
patent: 5576560 (1996-11-01), Runaldue et al.
patent: 5668389 (1997-09-01), Jassowski et al.
patent: 5811859 (1998-09-01), Shou et al.
patent: 61-27674 (1986-02-01), None
patent: 2-12823 (1990-01-01), None
patent: 5-13449 (1993-01-01), None
patent: 9-23009 (1997-01-01), None
patent: WO 94/29898 (1994-12-01), None

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