Active solid-state devices (e.g. – transistors – solid-state diode – Plural dram cells share common contact or common trench
Reexamination Certificate
2006-04-25
2006-04-25
Wilson, Christian D. (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Plural dram cells share common contact or common trench
C257S903000, C257S906000, C257S908000, C365S149000
Reexamination Certificate
active
07034408
ABSTRACT:
A memory device includes a DRAM memory cell array, which is implemented as a 6 F×F array, and peripheral circuitry. The word lines of the memory cell array are implemented as buried word lines, and, in addition, the bit lines including the bit line contacts are made of a bit line layer stack. The peripheral circuitry includes a peripheral transistor including first and second source/drain regions, a channel connecting the first and the second source/drain regions as well as a peripheral gate electrode for controlling an electrical current of the channel. The peripheral gate electrode is made of a peripheral gate stack including a layer stack which is identical with the bit line stack.
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Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Menz Douglas
Wilson Christian D.
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