Fabrication method for organic semiconductor transistor...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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Reexamination Certificate

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ABSTRACT:
Provided is a method for fabricating an organic semiconductor transistor having an organic polymeric gate insulating layer. The method includes forming an organic gate insulating layer on a substrate by a vapor deposition method using organic monomer sources, and causing a polymerization reaction to occur in the organic gate insulating layer to complete an organic polymeric gate insulating layer. Since the vapor deposition method, which is a low-temperature dry-type technique, is employed, the organic polymeric gate insulating layer can be uniformly formed on a large-area substrate by a simplified in-situ process.

REFERENCES:
patent: 1993-0001356 (1993-01-01), None
patent: 1994-022164 (1994-10-01), None
patent: 1999-024916 (1999-04-01), None
patent: 1999-0030877 (1999-05-01), None
patent: 2000-0003758 (2000-01-01), None
PCT International Search Report; International application No. PCT/KR01/01436; International filing date: Aug. 24, 2001; Date of Mailing: May 10, 2002.
PCT International Preliminary Examination Report; International application No. PCT/KRO2/01436; International filing date: Aug. 24, 2001; Date of Completion: Nov. 27, 2003.

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