Broken symmetry for optimization of resource fabric in a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Reexamination Certificate

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07114133

ABSTRACT:
The present invention is directed to a method and system for optimally mapping a general set of resources to a specific integrated circuit design. In an exemplary aspect of the present invention, a method for optimally mapping a general set of resources to a specific integrated circuit design may include the following steps. Sets of transistors are first abstracted into abstracted resources. The abstracted resources may include a transformative resource, a coordinating resource, and a state management resource, and the like. Then, a sea-of-platforms is utilized for unifying a flexible and malleable collection of the abstracted resources in such a way as to optimize the abstracted resources for a specific integrated circuit design. Broken symmetry may be used to optimize the abstracted resources for the specific integrated circuit design. The broken symmetry may be in at least one of a physical3-dimensional space, a temporal space and a code space.

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