Method of sequentially processing a plurality of lots each...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S712000

Reexamination Certificate

active

06911398

ABSTRACT:
A method of making a semiconductor device, comprises preparing a plurality of lots each including semiconductor substrates to be processed, the plurality of lots including at least first and second lots, processing the plurality of lots for every one lot, using a semiconductor manufacturing apparatus, judging whether or not the semiconductor manufacturing apparatus is subjected to cleaning before the second lot is processed, depending upon both a first processing type of the first lot to be processed and a second processing type of the second lot to be processed after the first lot, and processing the second lot without the cleaning in the case where the second lot does not require the cleaning.

REFERENCES:
patent: 5897378 (1999-04-01), Eriguchi
patent: 6168672 (2001-01-01), Nguyen
patent: 6214751 (2001-04-01), Lee
patent: 6280790 (2001-08-01), White et al.
patent: 6425953 (2002-07-01), Johnson
patent: 2001/0041311 (2001-11-01), Araki et al.
patent: 10-149990 (1998-06-01), None
patent: 10-199817 (1998-07-01), None
patent: 13-351868 (2001-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of sequentially processing a plurality of lots each... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of sequentially processing a plurality of lots each..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of sequentially processing a plurality of lots each... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3517428

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.