Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-02-08
2005-02-08
Wilczewski, Mary (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S371000, C257S339000, C257S500000
Reexamination Certificate
active
06853038
ABSTRACT:
A semiconductor device and a method for manufacturing the same are provided having a high breakdown voltage transistor and a low breakdown voltage transistor with different driving voltages in a common substrate. The semiconductor device includes: a semiconductor substrate of a first conductivity type; a first well of a second conductivity type formed in the semiconductor substrate; a second well of the first conductivity type formed within the first well; a third well of the second conductivity type formed within the first well; a low breakdown voltage transistor of the second conductivity type formed at the second well; a low breakdown voltage transistor of the first conductivity type formed at the third well; and a high breakdown voltage transistor of the first conductivity type formed at the first well. The second well and the third well have an impurity concentration higher than an impurity concentration of the first well.
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Harness & Dickey & Pierce P.L.C.
Lewis Monica
Seiko Epson Corporation
Wilczewski Mary
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