Semiconductor apparatus

Electronic digital logic circuitry – Interface – Supply voltage level shifting

Reexamination Certificate

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Details

C324S765010, C326S016000, C326S033000, C327S538000

Reexamination Certificate

active

06859067

ABSTRACT:
A semiconductor apparatus including programmability that may allow a SSTL interface or LVTTL interface is provided. A reference configuration circuit (100) may provide a primary reference potential VREF0and secondary reference potential VREF. Reference configuration circuit (100) may include a bond pad (PAD1), a reference potential generation circuit (1), a control circuit (50), a reference selection circuit (60), and a secondary reference potential generation circuit (70). During a wafer test mode, primary reference potential VREF0and secondary reference potential VREF may be provided from a potential that may be applied to bond pad (PAD1).

REFERENCES:
patent: 6339357 (2002-01-01), Yamasaki et al.
patent: 6469573 (2002-10-01), Kanda et al.
patent: 05-52900 (1993-03-01), None
patent: 09-63277 (1997-03-01), None
patent: 11-16342 (1999-01-01), None
patent: 11-66890 (1999-03-01), None
patent: 11-88146 (1999-03-01), None
patent: 11-134864 (1999-05-01), None
Japanese Office Action of Aug. 17, 2004.
English Translations of the indicated portions of the above-referenced Japanese Office Action.

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