Optics: measuring and testing – By light interference
Reexamination Certificate
2005-02-15
2005-02-15
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
C356S004090
Reexamination Certificate
active
06856397
ABSTRACT:
A bulge testing system (10) for testing the material properties of a thin film window (14) using a Michelson interferometer (18) that generates an interference pattern (32) having fringes (34) and nodes (36) that move as the thin film window is inflated or deflated. The bulge testing system includes a fringe counting module (82), an analysis module (114) and an output module (88). The fringe counting module allows a user to interactively select from an image of the interference pattern one or more sampling regions (30) in which the user interface will count fringes. The analysis module allows a user to interactively change the location of maxima/minima indicators (116) in the event that noise in the image causes the analysis module to incorrectly determine the locations of the fringes and nodes. The output module automatically calculates material properties and provides test results to an output file and/or a results window (168).
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Bulge and Blister Testing of Thin Films and Their Interfaces, Ph.D. Dissertation, Stanford University, by Robert J. Hohlfelder (1999); (specifically, pp. 95-120, Chapter 6,It's a nice theory, but how do you run experiments?)http://mse.stanford.edu/people/faculty
ix/people/past_members/rjhThesis/thesis.html.
Application of Bulge Testing Techniques in Determining the Mechanical Properties of Thin Films, Thesis by Jason Gill, University of Vermont (May, 1998).
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Huston Dryver R.
Sauter Wolfgang
Sonntag Peter A.
Downs Rachlin & Martin PLLC
The University of Vermont and State Agricultural College
Turner Samuel A.
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