Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-11-22
2005-11-22
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189090, C365S230060
Reexamination Certificate
active
06967882
ABSTRACT:
A read circuit is connected to bit lines of different cell arrays in common, and determines a logical value of data read out onto any bit line of the cell arrays. An error correcting circuit corrects an error in the data read out onto a common read data line, and outputs the data as corrected data. In order to write back the corrected data into a memory cell from which the corrected data has been originally read out, write switches connect a common write data line through which the corrected data is transmitted, to a corresponding bit line. Thus, during a read cycle the corrected data can be written back to the memory cell.
REFERENCES:
patent: 6683810 (2004-01-01), Sakamoto
patent: 6714477 (2004-03-01), Nakayama et al.
patent: 6731561 (2004-05-01), Abe et al.
patent: 6885608 (2005-04-01), Nagano
patent: 2000-011688 (2000-01-01), None
Arent & Fox PLLC
Nguyen Tuan T.
Phung Anh
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