Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-06-28
2005-06-28
Chaudhari, Chandra (Department: 2829)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S409000
Reexamination Certificate
active
06911693
ABSTRACT:
In order to form a MOS transistor device with a particularly low on resistance with a good avalanche strength at the same time, it is proposed to define the position and/or the configuration of avalanche breakdown regions by a variation and/or a course of the width and/or of the depth of the respective trench structure and/or of the respective mesa regions.
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Hirler Franz
Zundel Markus
Chaudhari Chandra
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Stemer Werner H.
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