Method for measuring size of multilayer structured container

Details Method for measuring size of multilayer structured container Method for measuring size of multilayer structured container

2005-10-11

2005-10-11

Porta, David (Department: 2878)

Radiant energy

Invisible radiant energy responsive electric signalling

With means to inspect passive solid objects

C250S358100

Reexamination Certificate

active

06953933

ABSTRACT:
A wall thickness of each layer or a size of a space between layers of a multilayer structured container can be easily measured with high accuracy. According to a method for measuring an inner size of a container by irradiating a multilayer structured container2as a target for measurement with X-rays radiated from an X-ray generating source12and by detecting the X-rays transmitting the container by a detector14, the X-ray generating source12, a slit15, and the detector14perform a linear scan to the container2in a direction orthogonal to beams17in addition to disposing the slit (a double slit)15which narrows the X-rays transmitting the container down to the narrow beams17in front of the detector14and disposing a focal spot12aof the X-ray generating source12, a center of the slit15, and a center of the detector14on a same straight line. The X-ray beams17are irradiated substantially parallel to a tangential direction of a container peripheral wall, and the X-rays transmitting the container peripheral wall are detected by the detector; thereby a thickness of each layer or the space between layers of the container peripheral wall is measured based on an obtained intensity distribution curve of damping on transmission.

REFERENCES:
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patent: 5717205 (1998-02-01), Matsumoto
patent: 5864601 (1999-01-01), Cattorini et al.
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patent: 6377654 (2002-04-01), Willems et al.
patent: 6600806 (2003-07-01), Istar

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