4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Katsuhiko Ogiso

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Method for measuring size of multilayer structured container

Radiant energy – Invisible radiant energy responsive electric signalling – With means to inspect passive solid objects
Reexamination Certificate

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X-ray condenser and x-ray apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2602477

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