Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-31
2005-05-31
Eckert, George (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S290000, C257S291000
Reexamination Certificate
active
06900485
ABSTRACT:
A unit pixel in a CMOS image sensor is employed to reduce a threshold voltage of a reset transistor by modifying a unit pixel circuit. The unit pixel in the CMOS image sensor including: a semiconductor substrate including an epitaxial layer in which an active area and a FOX area are defined; a photodiode formed in the epitaxial layer; a transfer transistor including source/drain regions disposed between the photodiode and a floating diffusion node, wherein a control signal is applied to a gate thereof; a reset transistor including source/drain regions disposed between the floating diffusion node and a VDD terminal, wherein a control signal is applied to a drain thereof; a drive transistor of which a gate is connected to the floating diffusion node and a drain is connected to the VDD terminal; and a selection transistor of which a drain is connected to the drain of the drive transistor and a source is connected to an output terminal, wherein a control signal is applied to a gate thereof.
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Eckert George
Fenty Jesse A.
Hynix / Semiconductor Inc.
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