Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-04
2005-10-04
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C438S017000
Reexamination Certificate
active
06952108
ABSTRACT:
A plasma probe that includes a substrate having substantially the same properties as those of a substrate to be processed, a bottom electrode layer located over the substrate and electrically isolated therefrom, a dielectric layer positioned over the bottom electrode layer including apertures through which one or more electrodes of the bottom electrode layer are exposed, and at least one upper electrode layer that is electrically isolated from the bottom electrode layer by way of the dielectric layer. Electrodes of the bottom and upper electrode layers communicate with meters which may provide real-time data representative of one or more properties of a region of a plasma to which the electrodes are exposed. The plasma probe may be fabricated by forming the bottom electrode layer over the substrate and separately forming one or more upper electrode layers over a sacrificial substrate. These structures are assembled with the dielectric layer therebetween.
REFERENCES:
patent: 5065201 (1991-11-01), Yamauchi
patent: 5315145 (1994-05-01), Lukaszek
patent: 5594328 (1997-01-01), Lukaszek
patent: 6051443 (2000-04-01), Ghio et al.
patent: 6140833 (2000-10-01), Flietner et al.
patent: 6144037 (2000-11-01), Ryan et al.
Boedo, J., “UCSD-FERP Boundary Diagnostics for NSTX,” NSTX PAC Meeting, May 1997, 6 pages.
“Fast Reciprocating Probes for Edge Profile Characterization on NSTX,” Jan. 1998, 1 page.
Lukaszek et al., CHARM: A New Wafer Surface Charge Monitor, TechCon '90, San Jose, 4 pages (no month/year).
Moyer, Rick, “Langmuir Probes and Boundary Plasma Measurements, ” Dill-D News, http://fusion.gat.com/DNT/DNT21.htm, Aug. 1994, 3 pages.
Moyer, Rick, “UC San Diego Boundary Diagnostics for NSTX,” NSTX FY98 Research Forum, Dec. 1997, pp. 1-11.
Moyer, Rick, “UC San Diego Boundary Diagnostics for NSTX,” NSTX FY98 Research Forum, Dec. 1997, pp. 1-12.
Moyer, Rick, “UC San Diego Fluctuation and Turbulent Transport Diagnostics for NSTX,” NSTX FY98 Research Forum, Dec. 1997, pp. 1-8.
Rudakov, D.L. et al., “Probe Diagnostics,” http://www.rsphysse.anu.edu.au/prl/probht.html, date unknown, 4 pages.
Micro)n Technology, Inc.
TraskBritt
LandOfFree
Methods for fabricating plasma probes does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods for fabricating plasma probes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for fabricating plasma probes will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3444706