Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-01-04
2005-01-04
Wojciechowicz, Edward (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C257S301000, C257S305000
Reexamination Certificate
active
06838718
ABSTRACT:
A ferroelectric memory comprising a select transistor and a ferroelectric capacitor is characterized in that the ferroelectric capacitor includes a dummy capacitor and a memory capacitor the first electrodes (storage node electrodes) of which are connected to one of the source and drain of the select transistor and which draw the same hysteresis curve, the second electrodes of the dummy capacitor and the memory capacitor are connected to a first plate line and a second plate line, and the potentials of these plate lines are set so as to polarize the dummy capacitor and the memory capacitor in opposite directions to each other with respect to the first electrode.
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Hiroshi Ishiwara: “Proposal of a Novel Ferroelectric-Gate Field Effect Transistor With Separated Functions for Data Read-Out and Data Storage”; Extended Abstracts of the International Conference on Solid State Devices and Materials, Japan Society Applied Physics, Sep. 1998 (19998-09) XP-000823151; pp. 222-223.
Morgan & Lewis & Bockius, LLP
Rohm & Co., Ltd.
Wojciechowicz Edward
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