Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-03-08
2005-03-08
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06865723
ABSTRACT:
A method of inserting test points in a circuit design includes selecting a node in the circuit design, determining a driver cell of the node, selecting a replacement cell for the driver cell and replacing the driver cell in the circuit design with the replacement cell. The replacement cell has the same function of the driver cell as well as a test point function. Additionally, the replacement cell is chosen so as not to break timing.
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International Business Machines - Corporation
Levin Naum
Schmeiser Olsen & Watts
Smith Matthew
Walsh Robert A.
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